DLA - MIL-STD-883-1 CHANGE 1
TEST METHOD STANDARD ENVIRONMENTAL TEST METHODS FOR MICROCIRCUITS PART 1: TEST METHODS 1000-1999
| Organization: | DLA |
| Publication Date: | 24 September 2021 |
| Status: | active |
| Page Count: | 219 |
scope:
Purpose.
Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of microelectronic devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term "devices" includes such items as monolithic, multichip, film and hybrid microcircuits, microcircuit arrays, and the elements from which the circuits and arrays are formed. This standard is intended to apply only to microelectronic devices.
intended Use:
The intended use of this test method standard is to establish appropriate conditions for testing semiconductor devices to give test results that simulate the actual service conditions existing in... View More
Document History
