BSI - 22/30437195 DC
Draft BS IEC 62047-43 Ed.1.0 Semiconductor devices - Micro-electromechanical devices Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible electro-mechanical devices
pending, Most Current
| Organization: | BSI |
| Publication Date: | 23 February 2022 |
| Status: | pending |
| Page Count: | 18 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
Document History
22/30437195 DC
February 23, 2022
Draft BS IEC 62047-43 Ed.1.0 Semiconductor devices - Micro-electromechanical devices Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible electro-mechanical devices
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