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DLA - SMD-5962-97636 REV C

MICROCIRCUIT, DIGITAL, BIPOLAR, DUAL 4-INPUT NOR GATES WITH STROBE, MONOLITHIC SILICON

active, Most Current
Organization: DLA
Publication Date: 1 December 2022
Status: active
Page Count: 12
scope:

Scope.

This specification covers the performance requirements for NPN, silicon, low-power transistors. Four levels of product assurance (JAN, JANTX, JANTXV and JANS) are provided for each device type as specified in MIL-PRF-19500. Two levels of product assurance (JANHC and JANKC) are provided for each unencapsulated device type. Provisions for radiation hardness assurance (RHA) to eleven radiation levels are provided for quality levels JANTXV, JANS, JANHC, and JANKC. RHA level designators "E", "K", "U", "M", "D", "P", "L", "R", "F", "G", and "H" are appended to the device prefix to identify devices, which have passed RHA requirements.

intended Use:
  • Semiconductors conforming to this specification are intended for original equipment design applications and logistic support of existing equipment.

Document History

SMD-5962-97636 REV C
December 1, 2022
MICROCIRCUIT, DIGITAL, BIPOLAR, DUAL 4-INPUT NOR GATES WITH STROBE, MONOLITHIC SILICON
Scope. This specification covers the performance requirements for NPN, silicon, low-power transistors. Four levels of product assurance (JAN, JANTX, JANTXV and JANS) are provided for each device...
January 17, 2018
MICROCIRCUIT, DIGITAL, BIPOLAR, DUAL 4-INPUT NOR GATES WITH STROBE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
February 9, 2007
MICROCIRCUIT, DIGITAL, BIPOLAR, DUAL 4-INPUT NOR GATES WITH STROBE, MONOLITHIC silicon
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
September 22, 1997
MICROCIRCUIT, DIGITAL, BIPOLAR, DUAL 4-INPUT NOR GATES WITH STROBE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...

References

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