DOD - SMD 5962-97636
MICROCIRCUIT, DIGITAL, BIPOLAR, DUAL 4-INPUT NOR GATES WITH STROBE, MONOLITHIC SILICON
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| Organization: | DOD |
| Publication Date: | 17 January 2018 |
| Status: | active |
| Page Count: | 12 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
December 1, 2022
MICROCIRCUIT, DIGITAL, BIPOLAR, DUAL 4-INPUT NOR GATES WITH STROBE, MONOLITHIC SILICON
Scope.
This specification covers the performance requirements for NPN, silicon, low-power transistors. Four levels of product assurance (JAN, JANTX, JANTXV and JANS) are provided for each device...
SMD 5962-97636
January 17, 2018
MICROCIRCUIT, DIGITAL, BIPOLAR, DUAL 4-INPUT NOR GATES WITH STROBE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
February 9, 2007
MICROCIRCUIT, DIGITAL, BIPOLAR, DUAL 4-INPUT NOR GATES WITH STROBE, MONOLITHIC silicon
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
September 22, 1997
MICROCIRCUIT, DIGITAL, BIPOLAR, DUAL 4-INPUT NOR GATES WITH STROBE, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...