IEC - 62951-9
Semiconductor devices – Flexible and stretchable semiconductor devices – Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
active, Most Current
| Organization: | IEC |
| Publication Date: | 1 December 2022 |
| Status: | active |
| Page Count: | 22 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
scope:
This part of IEC 62951 specifies the test methods for evaluating the performance of unipolar-type one transistor one resistor (1T1R) resistive memory cells. The performance test methods in this document include read, forming, SET, RESET, endurance and retention. This document is applicable to flexible devices as well as rigid resistive memory devices without any limitations prone to device technology and size.
Document History
62951-9
December 1, 2022
Semiconductor devices – Flexible and stretchable semiconductor devices – Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
This part of IEC 62951 specifies the test methods for evaluating the performance of unipolar-type one transistor one resistor (1T1R) resistive memory cells. The performance test methods in this...