IEC - 62951-8
Semiconductor devices – Flexible and stretchable semiconductor devices – Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
active, Most Current
| Organization: | IEC |
| Publication Date: | 1 January 2023 |
| Status: | active |
| Page Count: | 18 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
scope:
This part of IEC 62951 defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include experimental procedures and the equipment to be used. It also includes general requirements for test conditions such as the temperature and relative humidity of the testing environment. The test method described in this document focuses on stability evaluation rather than reliability.
Document History
62951-8
January 1, 2023
Semiconductor devices – Flexible and stretchable semiconductor devices – Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
This part of IEC 62951 defines terms and specifies the test method for evaluating the stretchability, flexibility, and stability of flexible resistive memory. The test method descriptions include...