IEC 62951-3

Semiconductor devices – Flexible and strechable semiconductor devices – Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging

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Organization: IEC
Publication Date: 1 November 2018
Status: active
Page Count: 26
ICS Code (Other semiconductor devices): 31.080.99
scope:

This part of IEC 62951 specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.

Document History

IEC 62951-3
November 1, 2018
Semiconductor devices – Flexible and strechable semiconductor devices – Part 3: Evaluation of thin film transistor characteristics on flexible substrates under bulging
This part of IEC 62951 specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates,...

References

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