BSI - BS IEC 62373-1
Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Part 1: Fast BTI test for MOSFET
active, Most Current
| Organization: | BSI |
| Publication Date: | 31 March 2023 |
| Status: | active |
| Page Count: | 26 |
| ICS Code (Transistors): | 31.080.30 |
Document History
BS IEC 62373-1
March 31, 2023
Semiconductor devices - Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) Part 1: Fast BTI test for MOSFET
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