scope:

This document describes the frequency domain test methods to accurately determine the amount of signal propagation loss and delay for electrical printed boards, to meet the demand of high speed applications nowadays. As the data rate of high speed IO continues to increase (e.g., 10 Gbps and above), production testing and development testing require more precise and accurate high frequency methods. (Existing IPC-TM-650 Test Methods such as Method 2.5.5.12A are not adequate). Additionally, previous IPC test methods do not encompass traditional industry methods using VNA, such as thru-reflect-line (TRL), and recent developments of 2X-Thru test methods, etc. This test method is defined to close the gaps.

The scope of this test method includes:

• Calibration and/or de-embedding techniques

• Probing/test fixture choices that impact measurement quality

• Coupon Design

• Test sample pre-conditioning

• Environmental impact, etc.