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BSI - BS EN IEC 61967-8

Integrated circuits - Measurement of electromagnetic emissions Part 8: Measurement of radiated emissions - IC stripline method

active, Most Current
Organization: BSI
Publication Date: 30 June 2023
Status: active
Page Count: 22
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

BS EN IEC 61967-8
June 30, 2023
Integrated circuits - Measurement of electromagnetic emissions Part 8: Measurement of radiated emissions - IC stripline method
A description is not available for this item.
BS EN 61967-8
November 30, 2011
Integrated circuits - Measurement of electromagnetic emissions Part 8: Measurement of radiated emissions - IC stripline method
A description is not available for this item.

References

This document references:
EN 61967-2 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
Published by CENELEC on October 1, 2005
A description is not available for this item.
This document references:
EN IEC 61000-4-20 - Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Published by CENELEC on April 1, 2022
This part of IEC 61000 focuses on emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include...
This document references:
IEC 60050-131 - AMENDMENT 1 International Electrotechnical Vocabulary – Part 131: Circuit theory
Published by IEC on September 1, 2008
This part of IEC 60050 gives the general terminology used in the theory of electric and magnetic circuits, as well as general terms pertaining to circuit elements and their characteristics, to...
This document references:
IEC 60050-161 - Amendment 2 International Electrotechnical Vocabulary Chapter 161: Electromagnetic Compatibility
Published by IEC on April 1, 1998
A description is not available for this item.
This document references:
EN IEC 61967-1 - Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
Published by CENELEC on February 1, 2019
This part of IEC 61967 provides general information and definitions on the measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description...
This document references:
61000-4-20 - Electromagnetic compatibility (EMC) – Part 4-20: Testing and measurement techniques – Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Published by IEC on February 1, 2022
This part of IEC 61000 focuses on emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include...
This document references:
IEC 61967-2 - Integrated circuits Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions TEM cell and wideband TEM cell method
Published by IEC on September 1, 2005
This test procedure defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The IC being evaluated is mounted on an IC test printed circuit board (PCB) that is...
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