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CENELEC - EN 61967-2

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method

active, Most Current
Organization: CENELEC
Publication Date: 1 October 2005
Status: active
Page Count: 26
ICS Code (Other semiconductor devices): 31.080.99

Document History

EN 61967-2
October 1, 2005
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
A description is not available for this item.

References

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