UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

DLA - SMD-5962-92218 REV E

MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL EDGE TRIGGERED D FLIP-FLOP WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON

active, Most Current
Organization: DLA
Publication Date: 16 June 2023
Status: active
Page Count: 21
scope:

Scope.

This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics... View More

Document History

SMD-5962-92218 REV E
June 16, 2023
MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL EDGE TRIGGERED D FLIP-FLOP WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Replaceability....
December 7, 2016
MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL EDGE TRIGGERED D FLIP-FLOP WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
October 29, 2014
MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL EDGE TRIGGERED D FLIP-FLOP WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
March 12, 2008
MICROCIRCUIT, DIGITAL, FAST CMOS, OCTAL EDGE TRIGGERED D FLIP-FLOP WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
August 9, 1996
MICROCIRCUIT, DIGITAL, FAST CMOS OCTAL D-FLIP-FLOP WITH CLOCK ENABLE, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
A description is not available for this item.
May 14, 1993
MICROCIRCUIT, DIGITAL, FAST CMOS OCTAL D-FLIP-FLOP WITH CLOCK ENABLE, THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...

References

Advertisement