AFNOR - NF EN 60749-30/A1
Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 1 November 2011 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN 60749-30/A1
November 1, 2011
Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing
A description is not available for this item.
June 1, 2005
Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing
A description is not available for this item.
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