AFNOR - NF EN 60749-30
Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing
active
| Organization: | AFNOR |
| Publication Date: | 1 June 2005 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
November 1, 2011
Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing
A description is not available for this item.
NF EN 60749-30
June 1, 2005
Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing
A description is not available for this item.
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