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DLA - MIL-PRF-28750/6H

RELAY, SOLID STATE, HERMETICALLY SEALED, ISOLATED, 250 mA, 40 V DC, SIGNAL SWITCHING, SPST (N. O.)

active, Most Current
Organization: DLA
Publication Date: 1 December 2023
Status: active
Page Count: 5

Document History

MIL-PRF-28750/6H
December 1, 2023
RELAY, SOLID STATE, HERMETICALLY SEALED, ISOLATED, 250 mA, 40 V DC, SIGNAL SWITCHING, SPST (N. O.)
A description is not available for this item.
MIL-R-28750/6
December 10, 2014
RELAY, SOLID STATE, HERMETICALLY SEALED, ISOLATED, 250 MA, 40 V DC, SIGNAL SWITCHING, SPST (N. O.)
A description is not available for this item.
MIL-R-28750/6
July 6, 2009
RELAY, SOLID STATE, HERMETICALLY SEALED, ISOLATED, 250 MA, 40 V DC, SIGNAL SWITCHING, SPST (N. O.)
A description is not available for this item.
MIL-R-28750/6
June 23, 2003
RELAY, SOLID STATE, HERMETICALLY SEALED, ISOLATED, 250 MA, 40 V DC, SIGNAL SWITCHING, SPST (N. O.)
A description is not available for this item.
MIL-R-28750/6
June 16, 1998
RELAY, SOLID STATE, HERMETICALLY SEALED, ISOLATED, 250 MA, 40 V DC, SIGNAL SWITCHING, SPST (N. O.)
A description is not available for this item.
MIL-R-28750/6
June 16, 1998
RELAY, SOLID STATE, HERMETICALLY SEALED, ISOLATED, 250 MA, 40 V DC, SIGNAL SWITCHING, SPST (N. O.)
A description is not available for this item.
MIL-R-28750/6
February 16, 1993
RELAY, SOLID STATE, HERMETICALLY SEALED, ISOLATED, 250 MA, 40 V DC, SIGNAL SWITCHING, SPST (N. O.)
A description is not available for this item.
MIL-R-28750/6
August 28, 1991
RELAY, SOLID STATE, HERMETICALLY SEALED, ISOLATED, 250 MA, 40 V DC, SIGNAL SWITCHING, SPST (N. O.)
A description is not available for this item.
MIL-R-28750/6
April 12, 1985
RELAY, SOLID STATE, HERMETICALLY SEALED, ISOLATED, 250 MA, 40 V DC, SIGNAL SWITCHING, SPST (N. O.)
This specification is approved for use by all Departments and Agencies of the Department of Defense. The complete requirements for acquiring the relay described herein shall consist of this...
MIL-R-28750/6
July 7, 1982
RELAY, SOLID STATE, HERMETICALLY SEALED, ISOLATED, 250 MA, 40 V DC, SIGNAL SWITCHING, SPST (N. O.)
A description is not available for this item.
MIL-R-28750/6
August 21, 1981
RELAY, SOLID STATE, HERMETICALLY SEALED, ISOLATED, 250 MA, 40 V DC, SIGNAL SWITCHING, SPST (N. O.)
A description is not available for this item.
MIL-R-28750/6A
June 21, 1977
RELAY, SOLID STATE, HERMETICALLY SEALED, ISOLATED, 250 MA, 40 V DC, SIGNAL SWITCHING, SPST (N. O.)
A description is not available for this item.
MIL-R-28750/6
March 10, 1975
RELAY, SOLID STATE, HERMETICALLY SEALED, ISOLATED, 250 MA, 40 V DC, SIGNAL SWITCHING, SPST (N. O.)
A description is not available for this item.
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References

This document references:
MIL-PRF-28750 - RELAYS, SOLID-STATE, GENERAL SPECIFICATION FOR
Published by NPFC on May 6, 2019
A description is not available for this item.
This document references:
MIL-R-28750/7 - RELAY, SOLID STATE, HERMETICALLY SEALED, ISOLATED, 100 MA, 250 V DC, SIGNAL SWITCHING, SPST (N. O.)
Published by NPFC on December 18, 2014
A description is not available for this item.
This document references:
MIL-STD-202-204 - TEST METHOD STANDARD METHOD 204, VIBRATION, HIGH FREQUENCY
Published by NPFC on April 18, 2015
Purpose. The high frequency vibration test is performed for the purpose of determining the effect on component parts of vibration in the frequency ranges of 10 to 500 hertz (Hz), 10 to 2,000 Hz or 10...
This document references:
MIL-STD-202-211 - TEST METHOD STANDARD METHOD 211, TERMINAL STRENGTH
Published by NPFC on December 15, 2020
Purpose. This test is performed to determine whether the design of the terminals and their method of attachment can withstand one or more of the applicable mechanical stresses to which they will be...
This document references:
MIL-STD-202-213 - Method 213, Shock (Specified Pulse)
Published by NPFC on January 22, 2020
A description is not available for this item.
This document references:
MIL-STD-750F CHANGE 3 - TEST METHODS FOR SEMICONDUCTOR DEVICES
Published by DLA on April 1, 2021
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
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