BSI - 24/30479444 DC
Draft BS ISO 20263 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
pending
| Organization: | BSI |
| Publication Date: | 5 February 2024 |
| Status: | pending |
| Page Count: | 56 |
| ICS Code (Optical equipment): | 37.020 |
| ICS Code (Physicochemical methods of analysis): | 71.040.50 |
Document History
24/30479444 DC
February 5, 2024
Draft BS ISO 20263 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
A description is not available for this item.
December 31, 2017
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
A description is not available for this item.