BSI - BS ISO 20263
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
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| Organization: | BSI |
| Publication Date: | 31 December 2017 |
| Status: | active |
| Page Count: | 54 |
| ICS Code (Optical equipment): | 37.020 |
| ICS Code (Physicochemical methods of analysis): | 71.040.50 |
Document History
February 5, 2024
Draft BS ISO 20263 Microbeam analysis. Analytical electron microscopy. Method for the determination of interface position in the cross-sectional image of the layered materials
A description is not available for this item.
BS ISO 20263
December 31, 2017
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
A description is not available for this item.