CENELEC - EN IEC 60749-5
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
active, Most Current
| Organization: | CENELEC |
| Publication Date: | 1 January 2024 |
| Status: | active |
| Page Count: | 14 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.
This test method is considered destructive.
Document History
EN IEC 60749-5
January 1, 2024
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.
This test...
July 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid...
March 1, 2003
Semiconductor devices Mechanical and climatic test methods Part 5: Steady-state temperature humidity bias life test
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