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ECIA - EIA-364-23

TP-23C Low Level Contact Resistance Test Procedure For Electrical Connectors and Sockets

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Organization: ECIA
Publication Date: 1 June 2006
Status: inactive
Page Count: 12
scope:

This test procedure may apply to any type or combination of current carrying members such as pin and socket contacts, relay contacts, wire and crimp connectors, or printed circuit board and contact.

Document History

June 1, 2006
TP-23C Low Level Contact Resistance Test Procedure For Electrical Connectors and Sockets
This test procedure may apply to any type or combination of current carrying members such as pin and socket contacts, relay contacts, wire and crimp connectors, or printed circuit board and contact.
EIA-364-23
June 1, 2006
TP-23C Low Level Contact Resistance Test Procedure For Electrical Connectors and Sockets
This test procedure may apply to any type or combination of current carrying members such as pin and socket contacts, relay contacts, wire and crimp connectors, or printed circuit board and contact.
June 1, 2006
TP-23C LOW LEVEL CONTACT RESISTANCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS
This set procedure may apply to any type or combination of current carrying members such as pin and socket contacts, relay contacts, wire and crimp connectors, or printed circuit board and contact....
December 1, 2000
TP-23B Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets
This test procedure may apply to any type or combination of current carrying members such as pin and socket contacts, relay contacts, wire and crimp connectors, or printed circuit board and contact....
January 1, 1985
TP-23A Low Level Contact Resistance Test Procedure for Electrical Connectors
A description is not available for this item.

References

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