ECIA - EIA-364-23
TP-23B Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets
|Publication Date:||1 December 2000|
This test procedure may apply to any type or combination of current carrying members such as pin and socket contacts, relay contacts, wire and crimp connectors, or printed circuit board and contact.
The object of this test procedure is to detail a standard method to measure the electrical resistance of two current carrying members in mutual contact. This test procedure specifies test voltages which will not disturb insulating films on the contacting surface nor cause asperity melting. This procedure addresses the effect of thermal EMF's, a source of measurement error.