ECIA - EIA-364-23
TP-23B Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets
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| Organization: | ECIA |
| Publication Date: | 1 December 2000 |
| Status: | inactive |
| Page Count: | 14 |
scope:
This test procedure may apply to any type or combination of current carrying members such as pin and socket contacts, relay contacts, wire and crimp connectors, or printed circuit board and contact.
Object
The object of this test procedure is to detail a standard method to measure the electrical resistance of two current carrying members in mutual contact. This test procedure specifies test voltages which will not disturb insulating films on the contacting surface nor cause asperity melting. This procedure addresses the effect of thermal EMF's, a source of measurement error.
Document History
June 1, 2022
TP-23D Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets
This test procedure may apply to any type or combination of current carrying members such as pin and socket contacts, relay contacts, wire and crimp connectors, or printed circuit board and contact.
June 1, 2006
TP-23C Low Level Contact Resistance Test Procedure For Electrical Connectors and Sockets
This test procedure may apply to any type or combination of current carrying members such as pin and socket contacts, relay contacts, wire and crimp connectors, or printed circuit board and contact.
June 1, 2006
TP-23C Low Level Contact Resistance Test Procedure For Electrical Connectors and Sockets
This test procedure may apply to any type or combination of current carrying members such as pin and socket contacts, relay contacts, wire and crimp connectors, or printed circuit board and contact.
June 1, 2006
TP-23C LOW LEVEL CONTACT RESISTANCE TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS
This set procedure may apply to any type or combination of current carrying members such as pin and socket contacts, relay contacts, wire and crimp connectors, or printed circuit board and contact....
EIA-364-23
December 1, 2000
TP-23B Low Level Contact Resistance Test Procedure for Electrical Connectors and Sockets
This test procedure may apply to any type or combination of current carrying members such as pin and socket contacts, relay contacts, wire and crimp connectors, or printed circuit board and contact....
January 1, 1985
TP-23A Low Level Contact Resistance Test Procedure for Electrical Connectors
A description is not available for this item.