DOD - SMD 5962-96557
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 8-BIT SERIAL-IN/PARALLEL-OUT SHIFT REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
inactive
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| Organization: | DOD |
| Publication Date: | 24 July 2012 |
| Status: | inactive |
| Page Count: | 24 |
scope:
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
October 13, 2017
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 8-BIT SERIAL-IN/PARALLEL-OUT SHIFT REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
September 12, 2013
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 8-BIT SERIAL-IN/PARALLEL-OUT SHIFT REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
SMD 5962-96557
July 24, 2012
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 8-BIT SERIAL-IN/PARALLEL-OUT SHIFT REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V). A choice of case outlines and lead finishes are...
September 9, 2009
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 8-BIT SERIAL-IN/PARALLEL-OUT SHIFT REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
August 2, 2004
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 8-BIT SERIAL-IN/PARALLEL-OUT SHIFT REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
November 1, 2001
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 8-BIT SERIAL-IN/PARALLEL-OUT SHIFT REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
November 18, 1996
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 8-BIT SERIAL-IN/PARALLEL-OUT SHIFT REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
A description is not available for this item.
April 24, 1996
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 8-BIT SERIAL-IN/PARALLEL-OUT SHIFT REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...