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BSI - BS ISO 16592

Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method

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Organization: BSI
Publication Date: 31 August 2012
Status: active
Page Count: 22
ICS Code (Physicochemical methods of analysis): 71.040.50

Document History

BS ISO 16592
August 31, 2012
Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
A description is not available for this item.
BS ISO 16592
October 31, 2006
Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
A description is not available for this item.

References

This document references:
BS ISO 5725-6 - Accuracy (trueness and precision) of measurement methods and results - Part 6: Use in practice of accuracy values
Published by BSI on April 15, 1995
A description is not available for this item.
This document references:
BS ISO 23833 - Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
Published by BSI on April 30, 2013
A description is not available for this item.
This document references:
BS ISO 22309 - Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
Published by BSI on October 31, 2011
A description is not available for this item.
This document references:
BS ISO 14595 - Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
Published by BSI on June 30, 2023
A description is not available for this item.
This document references:
BS ISO 14594 - Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
Published by BSI on November 30, 2014
A description is not available for this item.
This document is referenced by:
BS ISO 11938 - Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
Published by BSI on April 30, 2013
A description is not available for this item.
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