UNLIMITED FREE
ACCESS TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Select Your Free Newsletters

Industry Newsletters

Select Your Free Product Alerts

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

New! AI Engineering Assistant 
- Trained on our vast library of engineering resources.

BSI - BS ISO 23833

Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary

active, Most Current
Buy Now
Organization: BSI
Publication Date: 30 April 2013
Status: active
Page Count: 38
ICS Code (Chemical technology (Vocabularies)): 01.040.71
ICS Code (Other standards related to analytical chemistry): 71.040.99

Document History

BS ISO 23833
April 30, 2013
Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
A description is not available for this item.
BS ISO 23833
January 31, 2007
Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
A description is not available for this item.

References

This document references:
ISO 1087-1 - Terminology Work - Vocabulary - Part 1: Theory and Application
Published by ISO on October 15, 2000
This International Standard establishes a basic vocabulary for the theory and application of terminology work. It does not embrace the vocabulary dealing with computer applications in terminology...
This document references:
BS ISO 18115-2 - Surface chemical analysis - Vocabulary Part 2: Terms used in scanning-probe microscopy
Published by BSI on August 31, 2010
A description is not available for this item.
This document references:
ISO/IEC GUIDE 99 - International vocabulary of metrology - Basic and general concepts and associated terms (VIM)
Published by ISO on January 1, 2007
In this Vocabulary, a set of definitions and associated terms is given, in English and French, for a system of basic and general concepts used in metrology, together with concept diagrams to...
This document references:
BS ISO 704 - Terminology work — Principles and methods
Published by BSI on January 31, 2010
A description is not available for this item.
This document references:
ISO/IEC GUIDE 99 - International vocabulary of metrology - Basic and general concepts and associated terms (VIM)
Published by ISO on January 1, 2007
In this Vocabulary, a set of definitions and associated terms is given, in English and French, for a system of basic and general concepts used in metrology, together with concept diagrams to...
This document is referenced by:
BS ISO 11938 - Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
Published by BSI on April 30, 2013
A description is not available for this item.
This document is referenced by:
BS ISO 15632 - Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
Published by BSI on February 28, 2021
A description is not available for this item.
View Less
View All
Advertisement