AFNOR - NF EN 60749-23/A1
Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 1 May 2012 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN 60749-23/A1
May 1, 2012
Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life
A description is not available for this item.
July 1, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life
A description is not available for this item.