AFNOR - NF EN 60749-23
Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life
active
| Organization: | AFNOR |
| Publication Date: | 1 July 2004 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
May 1, 2012
Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life
A description is not available for this item.
NF EN 60749-23
July 1, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 23 : high temperature operating life
A description is not available for this item.
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