CEI EN 60749-7
Semiconductor devices - Mechanical and climatic test methods Part 7: Internal moisture content measurement and the analysis of other residual gases
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| Organization: | CEI |
| Publication Date: | 1 June 2012 |
| Status: | active |
| Page Count: | 16 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.
Document History
CEI EN 60749-7
June 1, 2012
Semiconductor devices - Mechanical and climatic test methods Part 7: Internal moisture content measurement and the analysis of other residual gases
This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a...
March 1, 2004
Semiconductor devices - Mechanical and climatic test method - Part 3: Internal moisture content measurement and the analysis of other residual gases
La presente Norma internazionale fa parte della serie IEC 60749 e descrive tre metodi per provare e misurare il tasso del vapore acqueo e di altri gas presenti internamente ad un dispositivo a...