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IEC 62396-2

Process management for avionics – Atmospheric radiation effects – Part 2: Guidelines for single event effects testing for avionics systems

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Organization: IEC
Publication Date: 1 September 2012
Status: inactive
Page Count: 42
ICS Code (Production. Production management): 03.100.50
ICS Code (Electronic components in general): 31.020
ICS Code (Aerospace electric equipment and systems): 49.060
scope:

This part of IEC 62396 aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to atmospheric neutrons at aircraft altitudes.

Although developed for the avionics industry, this process may be applied by other industrial sectors.

Document History

IEC 62396-2
December 1, 2017
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems
This part of IEC 62396 aims to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons...
IEC 62396-2
September 1, 2012
Process management for avionics – Atmospheric radiation effects – Part 2: Guidelines for single event effects testing for avionics systems
This part of IEC 62396 aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric...
IEC/TS 62396-2
August 1, 2008
Process management for avionics – Atmospheric radiation effects – Part 2: Guidelines for single event effects testing for avionics systems
The purpose of this technical specification is to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE)...
IEC/PAS 62396-2
September 1, 2007
Process management for avionics – Atmospheric radiation effects – Part 2: Guidelines for single event effects testing for avionics systems
A description is not available for this item.

References

This document references:
IEC 62396-1 - Process management for avionics – Atmospheric radiation effects – Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
Published by IEC on January 1, 2016
This part of IEC 62396 is intended to provide guidance on atmospheric radiation effects on avionics electronics used in aircraft operating at altitudes up to 60 000 ft (18,3 km). It defines the...
This document references:
ASTM F1192 - Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Published by ASTM on October 1, 2011
This guide defines the requirements and procedures for testing integrated circuits and other devices for the effects of single event phenomena (SEP) induced by irradiation with heavy ions having an...
This document references:
IEC 62396-1 - Process management for avionics – Atmospheric radiation effects – Part 1: Accommodation of atmospheric radiation effects via single event effects within avionics electronic equipment
Published by IEC on January 1, 2016
This part of IEC 62396 is intended to provide guidance on atmospheric radiation effects on avionics electronics used in aircraft operating at altitudes up to 60 000 ft (18,3 km). It defines the...
This document references:
JEDEC JESD 13 - Description of "B" Series CMOS Devices, Spec. for
Published by JEDEC on January 1, 1980
This standard provides for uniformity, multiplicity of sources, elimination of confusion, and ease of device specifications and system design by users. It gives electrical levels and timing diagrams...
This document references:
JEDEC JESD 57 - Test Procedures for the Measurement of Single-Event Effects in Semiconductor Devices from Heavy Ion Irradiation
Published by JEDEC on December 1, 1996
This test method defines requirements and procedures for ground simulation and single event effects (SEE) and implementation of the method in testing integrated circuits. This standard is valid when...
This document references:
IEC 62396-3 - Process management for avionics - Atmospheric radiation effects - Part 3: System design optimization to accommodate the single event effects (SEE) of atmospheric radiation
Published by IEC on September 1, 2013
This part of IEC 62396 provides guidance and furthermore it provides necessary requirements for those involved in the design of avionic systems and equipment and the resultant effects of atmospheric...
This document is referenced by:
BS DD IEC TS 62239 - Process management for avionics Preparation of an electronic components management plan
Published by BSI on August 14, 2003
A description is not available for this item.
This document is referenced by:
JEDEC JESD 234 - TEST STANDARD FOR THE MEASUREMENT OF PROTON RADIATION SINGLE EVENT EFFECTS IN ELECTRONIC DEVICES
Published by JEDEC on October 1, 2013
This test standard defines the requirements and procedures for 40 to 500 MeV proton irradiation of electronic devices for Single Event Effects (SEE), and reporting the results. Protons are capable of...
This document is referenced by:
IEC TR 62396-6 - Process management for avionics – Atmospheric radiation effects – Part 6: Extreme space weather – Potential impact on the avionics environment and electronics
Published by IEC on July 1, 2017
This part of IEC 62396, which is a technical report, provides information intended to improve the understanding of extreme space weather events; it details the mechanisms and conditions that produce...
This document is referenced by:
EIA-933 - (R) Requirements for a COTS Assembly Management Plan
Published by SAE on August 1, 2020
This document applies to the development of Plans for integrating and managing COTS assemblies in electronic equipment and Systems for the commercial, military, and space markets; as well as other...
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