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BSI - BS DD IEC TS 62239

Process management for avionics Preparation of an electronic components management plan

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Organization: BSI
Publication Date: 14 August 2003
Status: active
Page Count: 26
ICS Code (Production. Production management): 03.100.50
ICS Code (Electronic components in general): 31.020
ICS Code (Aerospace electric equipment and systems): 49.060

Document History

BS DD IEC/TS 62239
March 31, 2009
Process management for avionics - Preparation of an electronic components management plan
A description is not available for this item.
BS DD IEC/TS 62239
March 31, 2009
Process management for avionics - Preparation of an electronic components management plan
This Technical Specification defines the requirements for developing an Electronic Components Management Plan (ECMP) to assure customers and regulatory agencies that all of the electronic components...
BS DD IEC TS 62239
August 14, 2003
Process management for avionics Preparation of an electronic components management plan
A description is not available for this item.

References

This document references:
DEF STAN 00-71 - Obsolescence Management
Published by MODUK on January 27, 2001
This Defence Standard establishes a framework for contracting for Obsolescence Management and provides guidance in planning a cost effective obsolescence management process, that is applicable...
This document references:
IEC 61967-1 - Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 1: General Conditions and Definitions
Published by IEC on December 1, 2018
This part of IEC 61967 provides general information and definitions on the measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description...
This document references:
IEC 61340-5-1 - Electrostatics – Part 5-1: Protection of electronic devices from electrostatic phenomena – General requirements
Published by IEC on May 1, 2016
This part of IEC 61340 applies to activities that: manufacture, process, assemble, install, package, label, service, test, inspect, transport or otherwise handle electrical or electronic parts,...
This document references:
IEC 61967-6 - Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 6: Measurement of conducted emissions – Magnetic probe method
Published by IEC on June 1, 2008
This part of the IEC 61967 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This...
This document references:
DIN IEC QC 001001 - IEC quality assessment system for electronic components (IECQ); basic rules; identical with IEC QC 001001, edition 1986
Published by DIN on February 1, 1988
A description is not available for this item.
This document references:
IEC 61967-1 - Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 1: General Conditions and Definitions
Published by IEC on December 1, 2018
This part of IEC 61967 provides general information and definitions on the measurement of conducted and radiated electromagnetic disturbances from integrated circuits. It also provides a description...
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