CENELEC - EN 62276
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
inactive
| Organization: | CENELEC |
| Publication Date: | 1 January 2013 |
| Status: | inactive |
| Page Count: | 44 |
| ICS Code (Piezoelectric devices): | 31.140 |
scope:
This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.
Document History
December 1, 2016
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
EN 62276
January 1, 2013
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single...
December 1, 2005
Medical electrical equipment – Safety of radiotherapy record and verify systems
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