CENELEC - EN 62276
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
active, Most Current
| Organization: | CENELEC |
| Publication Date: | 1 December 2016 |
| Status: | active |
| Page Count: | 46 |
| ICS Code (Piezoelectric devices): | 31.140 |
scope:
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators.
Document History
EN 62276
December 1, 2016
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
January 1, 2013
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
This International Standard applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single...
December 1, 2005
Medical electrical equipment – Safety of radiotherapy record and verify systems
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