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IEC 60862-3

Surface acoustic wave (SAW) filters of assessed quality Part 3: Standard outlines

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Organization: IEC
Publication Date: 1 October 2003
Status: active
Page Count: 40
ICS Code (Piezoelectric devices): 31.140

Document History

IEC 60862-3
October 1, 2003
Surface acoustic wave (SAW) filters of assessed quality Part 3: Standard outlines
A description is not available for this item.
IEC 60862-3
January 1, 1986
Surface Acoustic Wave (SAW) Filters Part 3: Standard Outlines (Chapter IV)
A description is not available for this item.

References

This document is referenced by:
IEC 60862-2 - Surface acoustic wave (SAW) filters of assessed quality – Part 2: Guidelines for the use
Published by IEC on May 1, 2012
This part of IEC 60862 gives practical guidance on the use of SAW filters which are used in telecommunications, measuring equipment, radar systems and consumer products. IEC 60862-1 should be...
This document is referenced by:
EN 60862-2 - Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
Published by CENELEC on August 1, 2012
This part of IEC 60862 gives practical guidance on the use of SAW filters which are used in telecommunications, measuring equipment, radar systems and consumer products. IEC 60862-1 should be...
This document is referenced by:
CEI EN IEC 61837-2 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections Part 2: Ceramic enclosures
Published by CEI on January 1, 2021
A description is not available for this item.
This document is referenced by:
IEC 62276 - Single crystal wafers for surface acoustic wave (SAW) device applications – Specifications and measuring methods
Published by IEC on October 1, 2016
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
This document is referenced by:
EN 62276 - Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
Published by CENELEC on December 1, 2016
This document applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers...
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