UNLIMITED FREE ACCESS TO THE WORLD'S BEST IDEAS

close
Already an Engineering360 user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your Engineering360 Experience

close
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

CEI EN 60891

Photovoltaic devices - Procedures for temperature and irradiance corrections to measured I-V characteristics

active, Most Current
Buy Now
Organization: CEI
Publication Date: 1 December 2012
Status: active
Page Count: 46
ICS Code (Solar energy engineering): 27.160
scope:

This standard defines procedures to be followed for temperature and irradiance corrections to the measured I-V (current-voltage) characteristics of photovoltaic devices. It also defines the procedures used to determine factors relevant for these corrections. Requirements for I-V measurement of photovoltaic devices are laid down in IEC 60904-1.

NOTE 1 The photovoltaic devices include a single solar cell with or without a protective cover, a sub-assembly of solar cells, or a module. A different set of relevant parameters for I-V correction applies for each type of device. Although the determination of temperature coefficients for a module (or sub-assembly of cells) may be calculated from single cell measurements, it should be noted that the internal series resistance and curve correction factor should be separately measured for a module or subassembly of cells.

NOTE 2 The term "test specimen" is used to denote any of these devices.

NOTE 3 Care should be taken regarding the use of I-V correction parameters. The parameters are valid for the PV device for which they have been measured. Variations may occur within a production lot or the type class.

Document History

CEI EN 60891
December 1, 2012
Photovoltaic devices - Procedures for temperature and irradiance corrections to measured I-V characteristics
This standard defines procedures to be followed for temperature and irradiance corrections to the measured I-V (current-voltage) characteristics of photovoltaic devices. It also defines the...
December 1, 2010
Photovoltaic devices - Procedures for temperature and irradiance corrections to measured I-V characteristics
La presente Norma definisce le procedure da seguire per le correzioni di temperatura e irraggiamento alle caratteristiche I-V misurate di dispositivi fotovoltaici. Essa definisce anche le procedure...
April 1, 1998
Procedures for temperature and irradiance corrections to measured I-V characteristics of crystalline silicon photovoltaic devices
La presente Norma descrive le procedure di correzione in funzione della temperatura e dell’irraggiamento delle caratteristiche I-V misurate su dispositivi fotovoltaici in silicio cristallino. Include...
September 1, 1995
Caratteristiche I-V di dispositivi fotovoltaici in silicio cristallino - Procedure di riporto dei valori misurati in funzione di temperatura e irraggiamento
La presente Norma è la versione italiana della Norma Europea CENELEC EN 60891, identica alla Pubblicazione IEC 891 (1987) più Modifica 1 (1992). Descrive le procedure di correzione in funzione della...

References

Advertisement