AFNOR - NF EN 60749-27/A1
Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM)
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 20 March 2013 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN 60749-27/A1
March 20, 2013
Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM)
A description is not available for this item.
December 1, 2006
Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM)
A description is not available for this item.