AFNOR - NF EN 60749-27
Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM)
active
| Organization: | AFNOR |
| Publication Date: | 1 December 2006 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
March 20, 2013
Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM)
A description is not available for this item.
NF EN 60749-27
December 1, 2006
Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM)
A description is not available for this item.
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