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IEC 62860

Test methods for the characterization of organic transistors and materials

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Organization: IEC
Publication Date: 1 August 2013
Status: active
Page Count: 28
ICS Code (Physics. Chemistry): 07.030
scope:

This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.

Purpose

The purpose of this standard is to provide a method for systematically characterizing organic transistors. These standards are intended to maximize reproducibility of published results by providing a framework for testing organic devices, whose unique properties cause measurement issues not typically encountered with inorganic devices. This standard stresses disclosure of the procedures used to measure data and extract parameters so that data quality may be easily assessed. This standard also sets guidelines for reporting data, so that information is clear and consistent throughout the research community and industry.

Document History

IEC 62860
August 1, 2013
Test methods for the characterization of organic transistors and materials
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization....

References

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