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DIN EN 60749-43

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plan (IEC 47/2169/CD:2013)

inactive
Organization: DIN
Publication Date: 1 October 2013
Status: inactive
Page Count: 63
ICS Code (Semiconductor devices in general): 31.080.01

Document History

May 1, 2018
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans (IEC 60749-43:2017); German version EN 60749-43:2017
Dieser Teil von IEC 60749 enthält Leitlinien für Qualifikationspläne zur Zuverlässigkeit von integrierten Halbleiter-IC-Produkten. Das vorliegende Dokument ist nicht für Militär- und...
DIN EN 60749-43
October 1, 2013
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plan (IEC 47/2169/CD:2013)
A description is not available for this item.

References

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