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NPFC - MIL-S-19500/58

SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH-POWER TYPE 2N665

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Organization: NPFC
Publication Date: 17 November 1958
Status: inactive
Page Count: 10

Document History

MIL-S-19500/58D VALID NOTICE 5
June 7, 2021
Semiconductor Device, Transistor, PNP, Germanium, High-Power Type 2N665
A description is not available for this item.
MIL-S-19500/58
July 13, 2011
Semiconductor Device, Transistor, PNP, Germanium, High-Power Type 2N665
A description is not available for this item.
MIL-S-19500/58
March 26, 2004
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH-POWER TYPE 2N665
A description is not available for this item.
MIL-PRF-19500/58
June 7, 1999
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH-POWER TYPE 2N665
A description is not available for this item.
MIL-S-19500/58
October 7, 1988
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH-POWER TYPE 2N665
A description is not available for this item.
MIL-S-19500/58
February 28, 1966
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH-POWER TYPE 2N665
This specification covers the detailed requirements for a high-power, germanium, PNP, Transistor. See figure 1 (TO-3).
MIL-S-19500/58
January 30, 1961
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH-POWER TYPE 2N665
A description is not available for this item.
MIL-S-19500/58
November 17, 1958
SEMICONDUCTOR DEVICE, TRANSISTOR, PNP, GERMANIUM, HIGH-POWER TYPE 2N665
A description is not available for this item.
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References

This document references:
MIL-PRF-19500R - SEMICONDUCTOR DEVICES, GENERAL SPECIFICATION FOR
Published by DLA on July 24, 2021
Scope. This specification establishes the general performance requirements for semiconductor devices. Product assurance is provided by effective screening, conformance inspection, and process...
This document references:
MIL-STD-202 - TEST METHOD STANDARD ELECTRONIC AND ELECTRICAL COMPONENT PARTS
Published by NPFC on February 6, 1956
A description is not available for this item.
This document references:
MIL-STD-750F CHANGE 3 - TEST METHODS FOR SEMICONDUCTOR DEVICES
Published by DLA on April 1, 2021
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
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