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JEDEC JEP 148

Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment

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Organization: JEDEC
Publication Date: 1 January 2014
Status: active
Page Count: 38
scope:

The purpose of this procedure provides a consistent frame work for reliability qualification using the Physics-of-Failure (PoF) concept, which

− is flexible with respect to the requirements of the intended application and market,

− makes optimum use of the supplier's advance quality planning and demonstration results gained during design and development and applicable knowledge based on design and technology similarities.

Planning quality and reliability in advance and gaining reliability results with the progress of a design and development process is efficiently supported by a systematic procedure for risk and opportunity assessment.

The qualification concept is based on customer - supplier partnership in order to achieve optimized efforts. The methodology applies to the reliability qualification of semiconductor devices and the processes for their development and manufacturing.

Document History

JEDEC JEP 148
January 1, 2014
Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment
The purpose of this procedure provides a consistent frame work for reliability qualification using the Physics-of-Failure (PoF) concept, which − is flexible with respect to the requirements of the...
December 1, 2008
Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment
A concept is outlined, which proactively integrates qualification into the development process and provides a systematic procedure as support tool to development and gives early focus on required...
April 1, 2004
Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment
A description is not available for this item.

References

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