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JEDEC JEP 148

Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment

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Organization: JEDEC
Publication Date: 1 April 2004
Status: inactive
Page Count: 42

Document History

January 1, 2014
Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment
The purpose of this procedure provides a consistent frame work for reliability qualification using the Physics-of-Failure (PoF) concept, which − is flexible with respect to the requirements of the...
December 1, 2008
Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment
A concept is outlined, which proactively integrates qualification into the development process and provides a systematic procedure as support tool to development and gives early focus on required...
JEDEC JEP 148
April 1, 2004
Reliability Qualification of Semiconductor Devices Based on Physics of Failure Risk and Opportunity Assessment
A description is not available for this item.
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