BSI - BS ISO 22493
Microbeam analysis - Scanning electron microscopy - Vocabulary
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| Organization: | BSI |
| Publication Date: | 30 April 2014 |
| Status: | active |
| Page Count: | 32 |
| ICS Code (Optical equipment): | 37.020 |
| ICS Code (Chemical technology (Vocabularies)): | 01.040.71 |
| ICS Code (Image technology (Vocabularies)): | 01.040.37 |
| ICS Code (Physicochemical methods of analysis): | 71.040.50 |
Document History
BS ISO 22493
April 30, 2014
Microbeam analysis - Scanning electron microscopy - Vocabulary
A description is not available for this item.
October 31, 2008
Microbeam analysis - Scanning electron microscopy - Vocabulary
A description is not available for this item.