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BSI - BS ISO 22493

Microbeam analysis - Scanning electron microscopy - Vocabulary

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Organization: BSI
Publication Date: 31 October 2008
Status: inactive
Page Count: 34
ICS Code (Optical equipment): 37.020
ICS Code (Chemical technology (Vocabularies)): 01.040.71
ICS Code (Image technology (Vocabularies)): 01.040.37
ICS Code (Physicochemical methods of analysis): 71.040.50

Document History

BS ISO 22493
April 30, 2014
Microbeam analysis - Scanning electron microscopy - Vocabulary
A description is not available for this item.
BS ISO 22493
October 31, 2008
Microbeam analysis - Scanning electron microscopy - Vocabulary
A description is not available for this item.

References

This document is referenced by:
BS DD ISO/TS 10798 - Nanotechnologies - Charaterization of singlewall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
Published by BSI on July 31, 2011
A description is not available for this item.
This document is referenced by:
BS PD ISO/TS 10797 - Nanotechnologies — Characterisation of single-wall carbon nanotubes using transmission electron microscopy
Published by BSI on June 30, 2012
A description is not available for this item.
This document is referenced by:
BS PD ISO/TR 19319 - Surface chemical analysis - Fundamental approaches to determination of lateral resolution in beam-based methods
Published by BSI on March 31, 2013
A description is not available for this item.

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