ISO 15625
Silk - Electronic test method for defects and evenness of raw silk
active, Most Current
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| Organization: | ISO |
| Publication Date: | 1 May 2014 |
| Status: | active |
| Page Count: | 22 |
| ICS Code (Textiles in general): | 59.080.01 |
scope:
This International Standard specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.
This International Standard is applicable to raw silk with the yearn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.
Document History
ISO 15625
May 1, 2014
Silk - Electronic test method for defects and evenness of raw silk
This International Standard specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.
This International Standard is applicable to raw silk with the...