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IEC 60122-1

Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification

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Organization: IEC
Publication Date: 1 August 2002
Status: inactive
Page Count: 88
ICS Code (Piezoelectric devices): 31.140
scope:

This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.

Document History

IEC 60122-1
December 1, 2017
Quartz crystal units of assessed quality – Part 1: Generic specification
This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
IEC 60122-1
December 1, 2017
AMENDMENT 1 Quartz crystal units of assessed quality – Part 1: Generic specification
FOREWORD This amendment has been prepared by IEC technical committee 49: Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection...
IEC 60122-1
August 1, 2002
Quartz Crystal Units of Assessed Quality - Part 1: Generic Specification
This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.

References

This document references:
IEC 60027-1 - Letter symbols to be used in electrical technology Part 1: General Amendment 1
Published by IEC on May 1, 1997
FOREWORD This amendment has been prepared by IEC technical committee 25: Quantities and units, and their letter symbols.
This document references:
IEC 60444-1 - Measurement of Quartz Crystal Unit Parameters by Zero Phase Technique in a Pi-Network - Part 1: Basic Method for the Measurement of Resonance Frequency and Resonance Resistance of Quartz Crystal Units by Zero Phase Technique in a Pi-Network
Published by IEC on January 1, 1986
A description is not available for this item.
This document references:
IEC 60068-2-21 - Environmental testing – Part 2-21:Tests – Test U: Robustness of terminations and integral mounting devices
Published by IEC on January 1, 2012
This part of IEC 60068 is applicable to all electrical and electronic components whose terminations or integral mounting devices are liable to be submitted to stresses during normal assembly or...
This document references:
IEC 60068-2-7 - Amendment 1 - Basic environmental testing procedures – Part 2-7: Tests – Test Ga and guidance: Acceleration, steady state
Published by IEC on June 1, 1986
To prove the structural suitability equipment and other electrotechnical when subjected to forces produced and the satisfactory performance of components, products, hereinafter referred to as...
This document is referenced by:
IEC 62884-1 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 1: Basic methods for the measurement
Published by IEC on June 1, 2017
This part of IEC 62884 specifies the measurement techniques for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DROs) and oscillators using FBAR...
This document is referenced by:
BS EN 168200 - Harmonized system of quality assessment for electronic components Sectional specification: Quartz crystal units (qualification approval)
Published by BSI on May 31, 1991
A description is not available for this item.
This document is referenced by:
BS EN IEC 60027-2 - Letter symbols to be used in electrical technology Part 2: Telecommunications and electronics
Published by BSI on April 30, 2019
A description is not available for this item.
This document is referenced by:
BS EN 60444-11 - Measurement of quartz crystal unit parameters Part 11: Standard method for the determination of the load resonance frequency ƒL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
Published by BSI on December 31, 2010
A description is not available for this item.
This document is referenced by:
BS EN 60689 - Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
Published by BSI on April 30, 2009
A description is not available for this item.
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