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DLA - SMD-5962-97576 REV A

MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, OCTAL EDGE-TRIGGERED D-TYPE FLIP FLOP WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 23 December 2002
Status: inactive
Page Count: 19

Document History

SMD-5962-97576 REV E
April 27, 2022
MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, OCTAL EDGE-TRIGGERED D-TYPE FLIP FLOP WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
Scope. This drawing documents two product assurance class levels consisting of high reliability (device classes Q) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-97576
January 28, 2016
MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, OCTAL EDGE-TRIGGERED D-TYPE FLIP FLOP WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD 5962-97576
September 1, 2010
MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, OCTAL EDGE-TRIGGERED D-TYPE FLIP FLOP WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-97576 REV B
April 21, 2003
MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, OCTAL EDGE-TRIGGERED D-TYPE FLIP FLOP WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-97576 REV A
December 23, 2002
MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, OCTAL EDGE-TRIGGERED D-TYPE FLIP FLOP WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
A description is not available for this item.
SMD-5962-97576
August 13, 1997
MICROCIRCUIT, DIGITAL, LOW VOLTAGE CMOS, OCTAL EDGE-TRIGGERED D-TYPE FLIP FLOP WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
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References

This document references:
JEDEC JESD 20 - Standard for Description of 54/74ACXXXXX and 54/74ACTXXXXX Advanced High-Speed CMOS Devices
Published by JEDEC on January 1, 1990
This standard describes electrical parameters for this class of CMOS devices.
This document references:
MIL-STD-1835 - Electronic Component Case Outlines
Published by NPFC on September 21, 2009
This standard establishes and maintains a compilation of electronic component case outlines and should be useful to all levels of manufacturing that culminate in the production of reliable and...
This document references:
MIL-HDBK-103 - LIST OF STANDARD MICROCIRCUIT DRAWINGS
Published by NPFC on March 8, 2021
Purpose. The Standard Microcircuit Drawing Program (SMDP) is directly under the auspices of the DoD Parts Management Program (PMP). The PMP is implemented by MIL-HDBK-512, "Parts Management." The PMP...
This document references:
MIL-HDBK-780D VALID NOTICE 1 - Standard Microcircuit Drawings
Published by DLA on December 28, 2021
A description is not available for this item.
This document references:
MIL-PRF-38535M - INTEGRATED CIRCUITS (MICROCIRCUITS) MANUFACTURING, GENERAL SPECIFICATION FOR
Published by DLA on November 1, 2022
Scope. This specification establishes the general performance requirements for integrated circuits or microcircuits and the quality and reliability assurance requirements, which are to be met for...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
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