UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

DLA - SMD-5962-92075

MICROCIRCUIT, DIGITAL, ECL, 68030/40 ECL/TTL CLOCK DRIVER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 4 June 1993
Status: inactive
Page Count: 18
scope:

This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and space application (device classes S and V), and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). Device class M microcircuits represent non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883, "Provisions for the use of MIL-STD-883 in conjunction with compliant non-JAN devices". When available, a choice of radiation hardness assurance (RHA) levels are reflected in the PIN.

The PIN shall be as shown in the following example:

Device classes M, B, and S RHA marked devices shall meet the MIL-M-38510 specified RHA levels and shall be marked with the appropriate RHA designator. Device classes Q and V RHA marked devices shall meet the MIL-I-38535 specified RHA levels and shall be marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.

The device type(s) shall identify the circuit function as follows:

Device type Generic number Circuit function 01 10H1042 68030/40 ECL/TTL clock driver 02 100H1042 68030/40 ECL/TTL clock driver, temperature compensated

The device class designator shall be a single letter identifying the product assurance level as follows:

Device class Device requirements documentation M Vendor self-certification to the requirements for non-JAN class B microcircuits in accordance with 1.2.1 of MIL-STD-883 B or S Certification and qualification to MIL-M-38510 Q or V Certification and qualification to MIL-I-38535

The case outline(s) shall be as designated in MIL-STD-1835 and as follows:

Outline letter Descriptive designator Terminals Package style Y See figure 1 28 Quad flat pack

The lead finish shall be as specified in MIL-M-38510 for classes M, B, and S or MIL-I-38535 for classes Q and V. Finish letter "X" shall not be marked on the microcircuit or its packaging. The "X" designation is for use in specifications when lead finishes A, B, and C are considered acceptable and interchangeable without preference.

Supply voltage range: ECL supply (VEE)- - - - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc TTL supply (VTT)- - - - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc Input voltage range: ECL inputs (VINE) - - - - - - - - - - - - - - - 0.0 V dc to VEE TTL inputs (VINT) - - - - - - - - - - - - - - - −0.5 V dc to +7.0 V dc Storage temperature range - - - - - - - - - - - - −65°C to +165°C Lead temperature (soldering, 10 seconds) - - - - +300°C Maximum junction temperature (TJ) - - - - - - - - +165°C Maximum power dissipation (PD): Device type 01 - - - - - - - - - - - - - - - - 460 mW Device type 02 - - - - - - - - - - - - - - - - 479 mW Thermal resistance, junction-to-case (θJC)- - - - 1.23°C/W

Supply voltage range (VEE, VTT) - - - - - - - - - 4.75 V dc to 5.25 V dc High Level input voltage range: ECL inputs (VIH) device type 01 2/- - - - - - - 3.830 V dc to 4.280 V dc ECL inputs (VIH) device type 02 2/- - - - - - - 3.835 V dc to 4.120 V dc TTL inputs (VIH)- - - - - - - - - - - - - - - - 2.0 V dc to VTT Low level input voltage range: ECL inputs (VIL) device type 01 2/- - - - - - - 3.050 V dc to 3.555 V dc ECL inputs (VIL) device type 02 2/- - - - - - - 3.190 V dc to 3.525 V dc TTL inputs (VIL) - - - - - - - - - - - - - - - −0.5 V dc to 0.8 V dc Case operating temperature range (TC) - - - - - - −55°C to +125°C

Fault coverage measurement of manufacturing logic tests (MIL-STD-883, test method 5012)- - - 3/ percent

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Microcircuits... View More

Document History

January 2, 2023
MICROCIRCUIT, DIGITAL, ECL, 68030/40 ECL/TTL CLOCK DRIVER, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Replaceability....
February 7, 2018
MICROCIRCUIT, DIGITAL, ECL, 68030/40 ECL/TTL CLOCK DRIVER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q and M) and space application (device class V). A choice of case outlines and lead finishes are...
October 2, 2006
MICROCIRCUIT, DIGITAL, ECL, 68030/40 ECL/TTL CLOCK DRIVER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
September 8, 1999
MICROCIRCUIT, DIGITAL, ECL, 68030/40 ECL/TTL CLOCK DRIVER, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Microcircuits covered by...
SMD-5962-92075
June 4, 1993
MICROCIRCUIT, DIGITAL, ECL, 68030/40 ECL/TTL CLOCK DRIVER, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes B, Q, and M) and...

References

Advertisement