JEDEC - EIA-318
Measurement of Reverse Recovery Time for Semiconductor Signal Diodes
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| Organization: | JEDEC |
| Publication Date: | 1 July 1996 |
| Status: | active |
| Page Count: | 19 |
scope:
This standard describes the measurement of signal diodes (IF <=500mA dc) reverse recovery times of less than 300 ns duration. It may, however, also be used for the measurement of longer recovery times. This standard is also intended to establish a method which to characterize the test fixture used for this measurement.
Document History
EIA-318
July 1, 1996
Measurement of Reverse Recovery Time for Semiconductor Signal Diodes
This standard describes the measurement of signal diodes (IF <=500mA dc) reverse recovery times of less than 300 ns duration. It may, however, also be used for the measurement of longer recovery...
January 1, 1996
Measurement of Reverse Recovery Time for Semiconductor Signal Diodes
A description is not available for this item.
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