JEDEC - 318-B
Measurement of Reverse Recovery Time for Semiconductor Signal Diodes
inactive
| Organization: | JEDEC |
| Publication Date: | 1 January 1996 |
| Status: | inactive |
| Page Count: | 19 |
Document History
July 1, 1996
Measurement of Reverse Recovery Time for Semiconductor Signal Diodes
This standard describes the measurement of signal diodes (IF <=500mA dc) reverse recovery times of less than 300 ns duration. It may, however, also be used for the measurement of longer recovery...
318-B
January 1, 1996
Measurement of Reverse Recovery Time for Semiconductor Signal Diodes
A description is not available for this item.