JEDEC JESD 47
Stress-Test-Driven Qualification of Integrated Circuits
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| Organization: | JEDEC |
| Publication Date: | 1 January 2007 |
| Status: | inactive |
| Page Count: | 26 |
Document History
December 1, 2022
Stress-Test-Driven Qualification of Integrated Circuits
This standard describes a baseline set of acceptance tests for use in qualifying electronic devices as new products, a product family, or as products in a process which is being changed.
These tests...
August 1, 2018
Stress-Test-Driven Qualification of Integrated Circuits
This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
These...
September 1, 2017
Stress-Test-Driven Qualification of Integrated Circuits
This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
These...
August 1, 2017
Stress-Test-Driven Qualification of Integrated Circuits
This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
These...
October 1, 2016
Stress-Test-Driven Qualification of Integrated Circuits
This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
These...
July 1, 2012
Stress-Test-Driven Qualification of Integrated Circuits
This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
These...
February 1, 2011
Stress-Test-Driven Qualification of Integrated Circuits
This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
These...
April 1, 2010
Stress-Test-Driven Qualification of Integrated Circuits
This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
March 1, 2009
Stress-Test-Driven Qualification of Integrated Circuits
This standard describes a baseline set of acceptance tests for use in qualifying electronic components as new products, a product family, or as products in a process which is being changed.
These...
December 1, 2007
Stress-Test-Driven Qualification of Integrated Circuits
A description is not available for this item.
JEDEC JESD 47
January 1, 2007
Stress-Test-Driven Qualification of Integrated Circuits
A description is not available for this item.
November 1, 2004
Stress-Test-Driven Qualification of Integrated Circuits
A description is not available for this item.
November 1, 2004
Stress-Test-Driven Qualification of Integrated Circuits
A description is not available for this item.
November 1, 2004
Stress-Test-Driven Qualification of Integrated Circuits
A description is not available for this item.
August 1, 2003
Stress-Test-Driven Qualification of Integrated Circuits
A description is not available for this item.
November 1, 2001
Stress-Test-Driven Qualification of Integrated Circuits
A description is not available for this item.
January 1, 1995
Stress-Test-Driven Qualification of Integrated Circuits
A description is not available for this item.