UNLIMITED FREE ACCESS TO THE WORLD'S BEST IDEAS

close
Already an Engineering360 user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your Engineering360 Experience

close
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

IEC 60749-23

Semiconductor devices Mechanical and climatic test methods Part 23: High temperature operating life

inactive
Buy Now
Organization: IEC
Publication Date: 1 February 2004
Status: inactive
Page Count: 26
ICS Code (Semiconductor devices in general): 31.080.01

Document History

March 1, 2011
Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily...
January 1, 2011
AMENDMENT 1 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life
A description is not available for this item.
IEC 60749-23
February 1, 2004
Semiconductor devices Mechanical and climatic test methods Part 23: High temperature operating life
A description is not available for this item.

References

Advertisement