IEC 60749-23
AMENDMENT 1 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life
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| Organization: | IEC |
| Publication Date: | 1 January 2011 |
| Status: | inactive |
| Page Count: | 10 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
March 1, 2011
Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily...
IEC 60749-23
January 1, 2011
AMENDMENT 1 Semiconductor devices – Mechanical and climatic test methods – Part 23: High temperature operating life
A description is not available for this item.
February 1, 2004
Semiconductor devices Mechanical and climatic test methods Part 23: High temperature operating life
A description is not available for this item.